Inductance Characterization of Small Interconnects Using Test-Signal Method
نویسندگان
چکیده
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signal (of small known amplitude and frequency) and a D.C. signal along with a Differential circuit. Other measurement techniques such as LCZ and TDR for measuring inductance parameters are faced with limitations of L values greater than 5nH. The Test Signal Injection compliments this method and facilitates measurement of very low L values, especially those encountered in high speed circuits. This technique is applicable in the designing and benchmarking stage and hence is used to model interconnect couplings before packaging and
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